2004 Electrical Overstress/Electrostatic Discharge Symposium 2004
DOI: 10.1109/eosesd.2004.5272812
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Dynamic temperature rise of shielded MR sensors during simulated electrostatic discharge pulses of variable pulse width

Abstract: The temperature rise from Electrostatic discharge (ESD) of shielded AMR sensors used for magnetic tape storage devices is studied using square wave voltage pulses with widths from 35 ns to 2 ms. A phenomenological model has been developed to describe the dynamic stripe temperature versus pulse width and power for the time range studied as well as for a wide range in sensor geometries. The temperature required to melt the stripes was determined to be 1437 ± 69 o C. The activation energy required to achieve a 2%… Show more

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Cited by 3 publications
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