Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

Molodkin, V. B.; Olikhovskii, S. I.; Len, E. G.; Kyslovskyy, Ye. M.; Reshetnyk, O. V.; Vladimirova, T. P.; Sheludchenko, B. V.; Skakunova, E. S.; Lizunov, V. V.; Kochelab, E. V.; Фодчук, І. М.; Klad’ko, V. P.

doi:10.15407/mfint.38.01.0099

Cited by 4 publications

(2 citation statements)

References 35 publications

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“…It was described in detail in previous articles (see Molodkin et al, 2016;Olikhovskii et al, 2019). The distinction of this formula from the kinematical one is only that the 'red' divergence at k !…”

Section: Reciprocal-space Mapsmentioning

confidence: 99%

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. II. Dynamical theory

Molodkin¹,

Olikhovskii²,

Dmitriev³

et al. 2021

Acta Cryst Sect A

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The analytical expressions for coherent and diffuse components of the integrated reflection coefficient are considered in the case of Bragg diffraction geometry for single crystals containing randomly distributed microdefects. These expressions are analyzed numerically for the cases when the instrumental integration of the diffracted X-ray intensity is performed on one, two or three dimensions in the reciprocal-lattice space. The influence of dynamical effects, i.e. primary extinction and anomalously weak and strong absorption, on the integrated intensities of X-ray scattering is investigated in relation to the crystal structure imperfections.

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Section: Reciprocal-space Mapsmentioning

confidence: 99%

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. II. Dynamical theory

Molodkin¹,

Olikhovskii²,

Dmitriev³

et al. 2021

Acta Cryst Sect A

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“…The theory of the method is continuously improved. Accurate analytical expressions were obtained [3] for the diffuse components of one-dimensional cross-sections and reciprocal space maps measured in Bragg diffraction setup for single crystals containing several types of defects. Analytical processing of experimental reflection curves and reciprocal space maps allowed determination of complex microdefect structures in silicon [4,5] and garnet [6,7] crystals exposed to radiation.…”

Section: Introductionmentioning

confidence: 99%

Capabilities of X-ray diffuse scattering method for study of microdefects in semiconductor crystals

Бублик¹,

Воронова²,

Щербачев³

2018

MoEM

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The capabilities of X-ray diffuse scattering (XRDS) method for the study of microdefects in semiconductor crystals have been overviewed. Analysis of the results has shown that the XRDS method is a highly sensitive and information valuable tool for studying early stages of solid solution decomposition in semiconductors. A review of the results relating to the methodological aspect has shown that the most consistent approach is a combination of XRDS with precision lattice parameter measurements. It allows one to detect decomposition stages that cannot be visualized using transmission electron microscopy (TEM) and moreover to draw conclusions as to microdefect formation mechanisms. TEM-invisible defects that are coherent with the matrix and have smeared boundaries with low displacement field gradients may form due to transmutation doping as a result of neutron irradiation and relaxation of disordered regions accompanied by redistribution of point defects and annihilation of interstitial defects and vacancies. For GaP and InP examples, a structural microdefect formation mechanism has been revealed associated with the interaction of defects forming during the decomposition and residual intrinsic defects. Analysis of XRDS intensity distribution around the reciprocal lattice site and the related evolution of lattice constant allows detecting different decomposition stages: first, the formation of a solution of Frenkel pairs in which concentration fluctuations develop, then the formation of matrix-coherent microdefects and finally coherency violation and the formation of defects with sharp boundaries. Fundamentally, the latter defects can be precipitating particles. Study of the evolution of diffuse scattering iso-intensity curves in GaP, GaAs(Si) and Si(O) has allowed tracing the evolution of microdefects from matrix-coherent ones to microdefects with smeared coherency resulting from microdefect growth during the decomposition of non-stoichiometric solid solutions heavily supersaturated with intrinsic (or impurity) components.

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Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. I. Semi-dynamical model

et al. 2020

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The analytical expressions for the coherent and diffuse components of the integrated reflection coefficient are considered in the case of asymmetric Bragg diffraction geometry for a single crystal of arbitrary thickness, which contains randomly distributed Coulomb-type defects. The possibility to choose the combinations of diffraction conditions optimal for characterizing defects of several types by accounting for dynamical effects in the integrated coherent and diffuse scattering intensities, i.e. primary extinction and anomalous absorption, has been analysed based on the statistical dynamical theory of X-ray diffraction by imperfect crystals. The measured integrated reflectivity dependencies of the imperfect silicon crystal on azimuthal angle were fitted to determine the diffraction parameters characterizing defects in the sample using the proposed formulas in semi-dynamical and semi-kinematical approaches.

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Dynamical Theory of Triple-Crystal X-ray Diffractometry and Characterization of Microdefects and Strains in Imperfect Single Crystals

Cited by 4 publications

References 35 publications

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. II. Dynamical theory

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. II. Dynamical theory

Capabilities of X-ray diffuse scattering method for study of microdefects in semiconductor crystals

Dynamical effects in the integrated X-ray scattering intensity from imperfect crystals in Bragg diffraction geometry. I. Semi-dynamical model

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