2023
DOI: 10.1002/aelm.202201303
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Dynamics of an Electrically Driven Phase Transition in Ca2RuO4 Thin Films: Nonequilibrium High‐Speed Resistive Switching in the Absence of an Abrupt Thermal Transition

Abstract: In Mott‐type resistive switching phenomena, which are based on the metal–insulator transition in strongly correlated materials, the presence of an abrupt temperature‐driven transition in the material is considered essential for achieving high‐speed and large‐resistance‐ratio switching. However, this means that the freedom of material/device design in applications is significantly reduced for this type of switching by the strict requirement of transition abruptness. Here, high‐speed, abrupt resistive switching … Show more

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Cited by 7 publications
(8 citation statements)
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“…While the current-induced metal-insulator transition of Ca 2 RuO 4 is generally hardly observed in epitaxial thin films grown by vacuum deposition methods such as pulsed laser deposition, [26][27][28][29][30] we have recently shown that the currentinduced transition becomes observable in nonvacuum-grown epitaxial films with increased resistivity of Ca 2 RuO 4 , which were grown by solid phase epitaxy at atmospheric pressure. 12,21) The Ca 2 RuO 4 thin films examined in this study were thus grown by the nonvacuum solid-phase epitaxy technique on various substrate materials, and the substrate effects on the crystal structures and nonlinear transport properties were investigated. In this study, 100 nm thick Ca 2 RuO 4 thin films were grown on single-crystal substrates of YAlO 3 (001), LaAlO 3 (001), LaSrGaO 4 (001), NdGaO 3 (110), (La,Sr)(Al,Ta)O 3 (LSAT) (100), and NdCaAlO 4 (100).…”
Section: Experimental Methodsmentioning
confidence: 99%
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“…While the current-induced metal-insulator transition of Ca 2 RuO 4 is generally hardly observed in epitaxial thin films grown by vacuum deposition methods such as pulsed laser deposition, [26][27][28][29][30] we have recently shown that the currentinduced transition becomes observable in nonvacuum-grown epitaxial films with increased resistivity of Ca 2 RuO 4 , which were grown by solid phase epitaxy at atmospheric pressure. 12,21) The Ca 2 RuO 4 thin films examined in this study were thus grown by the nonvacuum solid-phase epitaxy technique on various substrate materials, and the substrate effects on the crystal structures and nonlinear transport properties were investigated. In this study, 100 nm thick Ca 2 RuO 4 thin films were grown on single-crystal substrates of YAlO 3 (001), LaAlO 3 (001), LaSrGaO 4 (001), NdGaO 3 (110), (La,Sr)(Al,Ta)O 3 (LSAT) (100), and NdCaAlO 4 (100).…”
Section: Experimental Methodsmentioning
confidence: 99%
“…We first fabricated amorphous Ca 2 RuO x precursor thin films on the above six kinds of substrates by pulsed laser deposition, and then the solid-phase epitaxial growth of the Ca 2 RuO 4 thin films was conducted from the precursor films at a growth temperature of 1300 °C in an Ar (99%) + O 2 (1%) atmosphere with a pressure of 1.0 atm, as described in our previous papers. 12,21) Prior to precursor deposition, the YAlO 3 (001) and LaAlO 3 (001) substrates were etched with concentrated HCl solutions, and the other substrates were preannealed at 1300 °C (the same conditions as for the film growth) to form atomically flat step-and-terrace structures on their surfaces. [31][32][33] The crystal structures and surface morphologies of the Ca 2 RuO 4 thin films were analyzed by X-ray diffraction (XRD) and atomic force microscopy using a SmartLab (Rigaku), a D8 Discover (Bruker AXS Inc.) and a NanoCute (Hitachi High-Tech Co.).…”
Section: Experimental Methodsmentioning
confidence: 99%
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