2008
DOI: 10.1002/pssc.200776525
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Dynamics of microwave‐induced processes in photoexcited GaAs/AlGaAs heterostructures

Abstract: Photoluminescence (PL) of high‐quality GaAs/AlGaAs–based heterostructures (HS) shows a remarkable time‐dependent response to microwave irradiation pulses at temperature 2 K. The mw‐frequency was 36 GHz and the modulation pulse widths varied in a wide range. Sharp PL intensity flashes (reaching 100 fold enhancement) at the leading or/and trailing mw‐pulse edges are observed. The transient PL response exhibits a complex interplay of various mw‐induced physical processes: electron heating, electron and exciton de… Show more

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Cited by 3 publications
(3 citation statements)
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“…7,17 Under mw irradiation, the 1S and 2S FE PL intensities strongly increase (solid curves) as compared to those at P mw =0 (curves with circle symbols). 7,18 For the MDQW sample, 2De-h PL spectra are shown for two 2DEG density values (Fig.1c). Under mw irradiation, the spectra broaden, and the PL intensity increases at high photon energies (gray-colored area), as compared to the spectra observed at P mw = 0.…”
mentioning
confidence: 99%
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“…7,17 Under mw irradiation, the 1S and 2S FE PL intensities strongly increase (solid curves) as compared to those at P mw =0 (curves with circle symbols). 7,18 For the MDQW sample, 2De-h PL spectra are shown for two 2DEG density values (Fig.1c). Under mw irradiation, the spectra broaden, and the PL intensity increases at high photon energies (gray-colored area), as compared to the spectra observed at P mw = 0.…”
mentioning
confidence: 99%
“…1b,c are due to mw-heating of the 2D-electrons. [7][8][9][18][19][20] Fig . 2 shows the PL spectral variations along the excitation strip (y-direction) as imaged through the spectrometer.…”
mentioning
confidence: 99%
“…The relaxation times of ␦n, ␦n x are slower ͑ϳ10 −4 -10 −7 s͒. 19,22,24 The bolometric effect relaxation ͑⌬T L ͒ is very long. 14 Therefore, studying transient dynamics is important in clarifying the physical mechanisms that govern the effects caused by electron heating in semiconductor heterostructures.…”
Section: Introductionmentioning
confidence: 99%