The in-circuit impedance of a critical electrical system provides valuable information on its operating status and health. There are three common in-circuit impedance measurement approaches, namely the voltage-current (V-I) measurement approach, the capacitive coupling approach, and the inductive coupling approach. Among them, the inductive coupling approach does not require a direct electrical contact to the energized system-under-test (SUT) and therefore greatly simplifies the implementation without the need to shut down the system and eliminates the concern of electrical safety hazards.The conventional measurement setup of the inductive coupling approach requires two inductive probes and a two-port vector network analyzer (VNA) or a signal generation and data acquisition system (SGAS). This well-established two-probe setup (TPS) has been refined and improved over the years. Despite all these recent improvements, it still cannot eliminate the inherent probe-to-probe coupling which compromises the measurement accuracy when the two probes are placed very close to each other. This thesis develops an in-circuit impedance measurement setup with the use of only one inductive probe and it is experimentally verified. By introducing a single-probe setup (SPS), not only reduces the hardware overhead of the measurement setup but also fundamentally addresses the concern of probe-to-probe coupling. In addition, the proposed SPS incorporates power amplification and protection devices to maintain the measurement system's accuracy and improve the ruggedness for in-circuit impedance measurement of electrical systems in harsh electromagnetic environments with the presence of strong background noise and transient events. An error correction scheme has also been developed to recover measurement