Abstract:Copper zinc tin sulfide (CZTS) thin films have been deposited by spin coating technique at various copper concentration ranging from 0.5M to 2.5M. The XRD patterns show the existence of the three main characteristic peaks of CZTS (112), (220) and (312), which indicate the formation of the kesterite structure of CZTS. Gap energy was calculated based on the derivation method using the absorbance data, and the values obtained vary from 1.46 eV to 1.58 eV depending on the copper molarities. Hall effect measurement… Show more
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