Economic design of the life test with a warranty policy

Abstract

Considering a warranty policy, an optimal truncated life test procedure is developed for the generalized exponential distribution. A total cost model, which involves the costs of testing, experimental time, lot acceptance or rejection, and the warranty, is adopted to establish the loss function of Bayesian decision method. A proper sample size of life test and an acceptance number of threshold are determined to minimize the expected total cost for lot decision. An example regarding the lifetime quality of integrated circuit products is used to demonstrate the proposed method. Numerical results have shown that the proposed method is beneficial for the reduction of expected total cost.

Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests

“…Several work such as Chernoff [3] and Meeker and Hahn [4,5] studied optimum designs and compromise plans and outlined practical guidelines for planning an efficient ALT. Some recent developments on ALT include Ye et al [6], Pan and Yang [7], Tsai et al [8], and Ng et al [9]. Escobar and Meeker [2] provided a review on the accelerated test models.…”