IEEE Custom Integrated Circuits Conference 2006 2006
DOI: 10.1109/cicc.2006.320844
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EDA Challenges in Nano-scale Technology

Abstract: Since the onset of the 90 nm node the challenges associated with further transistor scaling while maintaining a consistently functional, reliable, and yielding design have increased substantially. While those challenges carry across the spectrum of the manufacturing, the EDA, and the design communities, we believe it is the responsibility and the goal of the EDA industry to deal with those issues as thoroughly and as seamlessly as possible to make those challenges transparent to the designer. In this paper we … Show more

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Cited by 14 publications
(4 citation statements)
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“…Unfortunately, recent developments create cause for concern that these trends are nearing their end of life [2][3][4][5]. The core clock rates of processors have stagnated due to power and thermal effects.…”
Section: Introductionmentioning
confidence: 99%
“…Unfortunately, recent developments create cause for concern that these trends are nearing their end of life [2][3][4][5]. The core clock rates of processors have stagnated due to power and thermal effects.…”
Section: Introductionmentioning
confidence: 99%
“…Scaling trends in CMOS technology have been and are tackled by different points of view in several specific research contributions. A few examples are [1]- [4], where device and/or system level parameters are analyzed and modelled under the light of scaled technology processes and possible choices. Effective predictors were proposed in these and other works to help technologists to understand the effects of their decisions on the electrical parameters of basic devices.…”
Section: Introductionmentioning
confidence: 99%
“…To facilitate the extraction of such unique physical characteristics, a physically unclonable function could be implemented. A PUF is a mathematical function that is derived from a physical system to generate unique signatures (responses R i ) to a corresponding (challenges C i ), where the challenge-response relation is defined by a process variability of semiconductor devices ( Kawa et al (2006)). Typical PUF responses are random, unpredictable and almost impossible to reproduce.…”
Section: Physical Unclonable Function Overviewmentioning
confidence: 99%
“…The differences in process parameters can be exposed at sub-clock period level to generate a unique chip biometric identity to provide authentication for each chip. A Physical Unclonable Function (PUF) is a physical system to leverage such process variations to generate a response to a challenge Kawa et al (2006). Traditional Challenge-Response Pair (CRP) PUFs are not well-suited for the software protection problem in offline settings as stated by Nithyanand and Solis (2012a) because they are vulnerable to observe once, run everywhere (OORE) attacks.…”
Section: Introductionmentioning
confidence: 99%