Eddy-Current Sensors with Asymmetrical Point Spread Function

Gajda, Janusz; Stencel, Marek

doi:10.3390/s16101642

Cited by 2 publications

(2 citation statements)

References 15 publications

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“…The probed area corresponds to the section of the PSF by a cutting plane at a lift-off distance from the coil. Quite logically, considering the spatial extension of the field, one would expect the PSF to be wider than the radius of the coil itself [ 17 , 18 ] and to decrease in magnitude as a function of the lift-off. It is thus important to estimate its width compared to our coil to ensure that the effective probing section is not larger than the sample itself.…”

Section: Methodsmentioning

confidence: 99%

Broadband Eddy Current Measurement of the Sheet Resistance of GaN Semiconductors

Belkacem,

Loete,

Phulpin

2024

Sensors

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Although the classical four-point probe method usually provides adequate results, it is in many cases inappropriate for the measurement of thin sheet resistance, especially in the case of a buried conductive layer or if the surface contacts are oxidized/degraded. The surface concentration of dislocation defects in GaN samples is known to challenge this kind of measurement. For the GaN sample presented in this study, it even totally impaired the ability of this method to even provide results without a prior deposition of gold metallic contact pads. In this paper, we demonstrate the benefits of using a new broadband multifrequency noncontact eddy current method to accurately measure the sheet resistance of a complicated-to-measure epitaxy-grown GaN-doped sample. The benefits of the eddy current method compared to the traditional four-point method are demonstrated. The multilayer-doped GaN sample is perfectly evaluated, which will allow further development applications in this field. The point spread function of the probe used for this noncontact method was also evaluated using a 3D finite element model using CST-Studio Suite simulation software 2020 and experimental measurements.

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Section: Methodsmentioning

confidence: 99%

Broadband Eddy Current Measurement of the Sheet Resistance of GaN Semiconductors

Belkacem,

Loete,

Phulpin

2024

Sensors

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“…However, the inductance component of the sensing coil expands rapidly in nonlinear form when the distance between the IPS and the target reduces. This process leads to the non-uniform distribution of the measurement resolution [ 42 ].…”

Section: Introductionmentioning

confidence: 99%

Dimension-Reduced Analog—Digital Mixed Measurement Method of Inductive Proximity Sensor

Guo

Shao

Tao

et al. 2017

Sensors

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Inductive proximity sensors (IPSs) present a unique no-contact advantage. They are widely preferred for displacement measurement in various industrial fields (e.g., aviation and aerospace), and they are improved continuously. When the inductance and resistance components of the IPS sensing core are separated, the influence of temperature drift on measurement can be eliminated. The complexity of online computation of component separation can be reduced using a two-dimensional look-up table method. However, this method exhibits disadvantages, such as large capacity of the look-up table, dependency on precision measurement of sensing core parameter, and nonlinear distribution of measurement resolution. This study aims to overcome these disadvantages by examining the nonlinear relationship between the response of the sensing core and the ambient temperature, and proposes a dimension-reduced measurement method. The proposed method extracts the characteristics of the response curves at two temperatures and calculates the characteristics of the response curves at any temperature using a linear approximation. The look-up table capacity is less than 0.37% of the two-dimensional look-up table capacity (condensed) under the same condition; dimension reduction enables the construction of a complete look-up table directly by calibration procedures and avoids precise measurement on sensing core parameters; the calibration procedures establish uniform mapping of the distribution of measurement resolution. The experiment shows that, when the measurement ranges are 0–6, 0–5, and 0–4 mm, the maximum measurement errors are 0.140, 0.065, and 0.040 mm, respectively, under temperature ranging from 20 ∘C to 110 ∘C. This study extends the measurement range from 0–5 mm to 0–7 mm and improves the measurement accuracy over 0.1 mm (50% at 5 mm) compared with the two-dimensional look-up table method. Therefore, the proposed method not only inherits the advantages of the original method but also achieves the above-mentioned expected capacity improvements effectively.

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Eddy-Current Sensors with Asymmetrical Point Spread Function

Cited by 2 publications

References 15 publications

Broadband Eddy Current Measurement of the Sheet Resistance of GaN Semiconductors

Broadband Eddy Current Measurement of the Sheet Resistance of GaN Semiconductors

Dimension-Reduced Analog—Digital Mixed Measurement Method of Inductive Proximity Sensor

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