Edge Corrections for Strip and Disc Capacitors

Wintle, H. J.; Kurylowicz, S.

doi:10.1109/tim.1985.4315253

Cited by 44 publications

(26 citation statements)

References 15 publications

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“…Although this last statement is obviously in principle correct, it is also equally evident that such a computation was carried out by simply employing the notoriously unrehable expression for the electric field in the gap only vahd in the highly ideahzed case of infinitely large plates compared to the gap width and by completely neglecting fringing effects (Wintle and Kurylowicz, 1985). This quantity was determined by those authors by exploiting the fact that "the force acting on the membrane can be calculated if the applied voltage and the distance between the electrode and plate, or membrane, respectively, are known."…”

Section: Calibration and Device Characterizationmentioning

confidence: 98%

Membrane Nano-Actuation by Light-Driven Manipulation of van der Waals Forces: A Progress Report

Pinto¹

2008

AIP Conference Proceedings

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An ongoing proof-of-concept demonstration of the resonant actuation of a thin membrane by periodic van der Waals forces between an illuminated semiconducting layer and a vibrating sensing element is reported. In the first phase of our effort, we have studied the mechanical response of a microphone membrane modified by a central rigid silica disk under the action of an electrostatic actuator inside a vacuum chamber. Unlike previous, and quite approximate, efforts by others, we obtained the first successful verification of the frequency response of a modified vibrating membrane to the excitation by an especially designed electrostatic actuator for the first three cylindrically symmetrical resonant modes of the system. In order to properly calibrate the capacitive device for the detection of membrane actuation by the van der Waals force, we proceeded by obtaining accurate calculations of the electrostatic force between the actuator and the modified microphone membrane. This demanding numerical effort, conducted in cylindrical coordinates by means of a simultaneous overrelaxation (SOR) algorithm coded in Compaq Fortran 90, has already exposed some undetected errors in the existing literature. We have also quantitatively proven that capacitance estimates from standard analytical equations appreciably depart from those obtained by accurate finite-difference models. This finding is extremely important since a detailed understanding of electrostatic calibration is at the basis of most contemporary experiments on van der Waals forces. We conclude by illustrating the next steps of our proof-of-concept activities and we comment on the overall technological relevance of our demonstration.

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Section: Calibration and Device Characterizationmentioning

confidence: 98%

Membrane Nano-Actuation by Light-Driven Manipulation of van der Waals Forces: A Progress Report

Pinto¹

2008

AIP Conference Proceedings

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“…For higher frequencies, (br o ) 1) an asymptotic expression can be used to substitute (1) yielding an expression for the input susceptance of the center-fed circular disk given by (2).…”

Section: Center-fed Circular Diskmentioning

confidence: 99%

“…The literature provides disk capacitance results obtained by Wintle and Kurylowicz [2] that used a conformal mapping approach, and by Nishiyama and Nakamura [3] that used a boundary element method. Those results were obtained considering e r ¼ 1-a limitation that our approach does not contain.…”

Section: Static Capacitancementioning

confidence: 99%

“…Accurate modeling of discrete components fabricated on printed circuit boards (PCBs) aimed at microelectronic and microwave applications has become a focus of attention over the last decades [1][2][3][4][5][6][7][8][9][10]. Among circuit components, disk capacitors are widely used for filtering, coupling, tuning, bypass, and noise suppression purposes.…”

Section: Introductionmentioning

confidence: 99%

“…In [1][2][3], MTM-engineered electrically small antenna designs were introduced. They were achieved by surrounding small electric or magnetic dipole radiating elements with an ENG (epsilon-negative) or MNG (mu-negative) spherical shell.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Static capacitance and resonance frequencies of an edge‐fed disk over a grounded dielectric slab

Faria

2010

Micro & Optical Tech Letters

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A multiconductor transmission‐line modal analysis technique is used to determine the frequency‐dependent input admittance of an edge‐fed disk resting over a grounded dielectric slab, fringing field effects being accounted for. The innovative analysis presented here considers the disk structure as the limit case of a ring device, whose internal radius is made negligibly small. By considering very‐low frequency regimes, a static approximation of the static disk capacitance is obtained and shown to agree with previous literature on the topic. For very‐high frequency regimes where the edge‐fed disk behaves as a resonator device, resonance frequencies are determined and compared against results concerning center‐fed disks; radiation effects are ignored in both cases. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52:966–971, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.25059

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Dielectric Measurement

Bartnikas¹

1999

Wiley Encyclopedia of Electrical and Electronics Engineering

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The sections in this article are DC Conductivity Measurements Permittivity and Loss Measurements on Lumped Capacitance Specimens Permittivity and Loss Measurements on Distributed Parameter Specimens Voltage Breakdown Strength Measurements Concluding Remarks

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Edge Corrections for Strip and Disc Capacitors

Cited by 44 publications

References 15 publications

Membrane Nano-Actuation by Light-Driven Manipulation of van der Waals Forces: A Progress Report

Membrane Nano-Actuation by Light-Driven Manipulation of van der Waals Forces: A Progress Report

Static capacitance and resonance frequencies of an edge‐fed disk over a grounded dielectric slab

Dielectric Measurement

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