2008
DOI: 10.1093/ietele/e91-c.5.703
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Effect of a Guard-Ring on the Leakage Current in a Si-PIN X-Ray Detector for a Single Photon Counting Sensor

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Cited by 10 publications
(3 citation statements)
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“…Notably, in Figure S1 L is the distance between the HI and the LO and L s > L is an alternative pathway for the charge carriers to travel without the GR. This approach has successfully been applied in X-/γ-ray detectors based on, for example, CdTe, , CdZnTe, , Si, and SiC . More recently, Wei et al showed that using GR reduces the crystal surface leakage current and device dark current in CH 3 NH 3 PbBr 3– x Cl x -based γ-ray detectors.…”
mentioning
confidence: 99%
“…Notably, in Figure S1 L is the distance between the HI and the LO and L s > L is an alternative pathway for the charge carriers to travel without the GR. This approach has successfully been applied in X-/γ-ray detectors based on, for example, CdTe, , CdZnTe, , Si, and SiC . More recently, Wei et al showed that using GR reduces the crystal surface leakage current and device dark current in CH 3 NH 3 PbBr 3– x Cl x -based γ-ray detectors.…”
mentioning
confidence: 99%
“…Their leakage currents come through guard rings under a reverse bias with the guard rings. So the reduction of I INTER and I SURF results in the decrease in the total leakage current [13].…”
Section: Introductionmentioning
confidence: 99%
“…In recent work, photodiodes structures with virtual guard rings have been studied to eliminate edge breakdown voltage and boost fill factor. One silicon PIN photodiode published with guard rings which has low dark current compared to PIN photodiode without guard ring (2,3). In other work, Intrinsic region effects on photodiode performance were investigated by using Silvaco TCAD simulation.…”
Section: Introductionmentioning
confidence: 99%