2019
DOI: 10.7567/1347-4065/ab23fa
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Effect of a SiC seed layer grown at different temperatures on SiC film deposition on top of an AlN/Si(110) substrate

Abstract: We have formed silicon carbide (SiC) seed layers at various substrate temperatures by ultralow-pressure chemical vapor deposition using monomethylsilane (CH 3 SiH 3 ) on aluminum nitride (AlN) films grown on off-axis Si(110) substrates. After that, we grew SiC films on the seed layers by pulsed laser deposition using a SiC target. We investigated the effects of the seed layers formed at various temperatures on the crystallinity and surface morphology of the SiC films thereon. The SiC films grown on the seed la… Show more

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Cited by 1 publication
(2 citation statements)
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“…For the AlN grown on off axis substrates (Figure 7a), a strong anisotropy of the recorded values, dependent on the azimuthal angle, with two FWHMs maxima separated by 180 • and corresponding to the [11][12][13][14][15][16][17][18][19][20] crystalline direction (i.e., the off-cut direction), was observed. The realization of either thermal annealing at 1330 • C or a CVD SiC growth process on such AlN films led to a significant evolution of the FWHMs.…”
Section: Electrical Behavior and Aln Structural Modifications Induced...mentioning
confidence: 99%
See 1 more Smart Citation
“…For the AlN grown on off axis substrates (Figure 7a), a strong anisotropy of the recorded values, dependent on the azimuthal angle, with two FWHMs maxima separated by 180 • and corresponding to the [11][12][13][14][15][16][17][18][19][20] crystalline direction (i.e., the off-cut direction), was observed. The realization of either thermal annealing at 1330 • C or a CVD SiC growth process on such AlN films led to a significant evolution of the FWHMs.…”
Section: Electrical Behavior and Aln Structural Modifications Induced...mentioning
confidence: 99%
“…Moreover, CVD usually provides higher growth rates than MBE (>1 µm/h). For AlN growth, various techniques can be employed: metalorganic CVD (MOCVD) [10,11,15,16], MBE [17], reactive sputtering [18], or laser-assisted sputtering [19].…”
Section: Introductionmentioning
confidence: 99%