2018
DOI: 10.4028/www.scientific.net/kem.764.106
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Effect of Abrasive Particle Size on Lapping of Sapphire Wafer by Fixed Abrasive Pad

Abstract: The choice of abrasive particle size is crucial to improve the lapping efficiency and surface quality in lapping of sapphire wafer by fixed abrasive (FA) pad. A model for the penetration depth of a single abrasive is developed with fixed abrasive pad. A serious of lapping tests were carried out using FA pads embedded with different size of diamond particles to verify the validity of the developed model. Results show that the penetration depth of abrasive is related not only to the particle size, but to the har… Show more

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“…It is mainly divided into the rotation of the spindle, the rotation of the workpiece deviating from the spindle, and the vertical feed movement of the workpiece. The relative movements of the workpiece and the polishing plate 31 result in the removal of LT, and the feed movement of the pressing head maintains the processing load. In this way, the surface roughness of the workpiece is reduced and LT is removed uniformly.…”
Section: The Establishment Of Kinetic Modelingmentioning
confidence: 99%
“…It is mainly divided into the rotation of the spindle, the rotation of the workpiece deviating from the spindle, and the vertical feed movement of the workpiece. The relative movements of the workpiece and the polishing plate 31 result in the removal of LT, and the feed movement of the pressing head maintains the processing load. In this way, the surface roughness of the workpiece is reduced and LT is removed uniformly.…”
Section: The Establishment Of Kinetic Modelingmentioning
confidence: 99%