Proceedings of the International Display Workshops
 2019
DOI: 10.36463/idw.2019.amdp1-17
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Effect of Ambient Atmosphere on Abnormal Degradation Behavior in Metal-Oxide Thin-Film Transistor under Positive Gate-Bias and Temperature Stress

JIAPENG LI1,
Lu Lu2,
Zhihe Xia3
et al.
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