Effect of an Elliptical Inclusion on Critical Current Density of a Long Cylindrical High-T c Superconductor

Xue, Feng; Zhang, Zhaoxia; Zeng, Jun; Gou, Xiaofan

doi:10.1007/s10948-016-3534-y

Cited by 9 publications

(1 citation statement)

References 16 publications

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“…In addition, the experiments [35] on NbN films coated with a Cu layer showed that the deflection of avalanche fronts follows the Snell's law, and the refraction index is determined by the ratio between the avalanche propagation velocities in the bare and coated film. The experiments and theoretical investigations on the inhomogeneous superconducting films patterned with macroholes, antidots or insulating particles have shown that the inhomogeneities strongly modify the current carrying capacity [36,37], guide the propagation of avalanches [38,39], and strongly modify the avalanche behaviors [40]. It is also found that shape and size of the inhomogeneties play an important role in the flux avalanche processes [41,42].…”

Section: Introductionmentioning

confidence: 99%

Influences of non-uniformities and anisotropies on the flux avalanche behaviors of type-II superconducting films

Jing

Yong

Zhou

2016

Supercond. Sci. Technol.

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In this paper, the anisotropic flux avalanche processes in thin square-shaped type-II superconducting films are numerically investigated by solving the coupled nonlinear Maxwell’s equations and the thermal diffusion equations. Influences of the non-uniformities and intrinsic critical current density anisotropies originate from the manufacturing process are considered in the simulation. In addition, we also studied the effect of the extrinsic anisotropy induced by the in-plane magnetic field. The results demonstrate that the non-uniformities and anisotropies of the critical current density play significant roles in the flux avalanche process of the thin film superconductors. Slight anisotropy (either intrinsic or extrinsic) can dramatically change the propagation direction of avalanches in the superconducting film, which is consistent with the experimental results. Simulations on the thin square-shaped isotropic superconducting films show that the threshold magnetic field for the flux avalanches increases with the angle between the applied field and the superconducting film-plane. In addition, the flux avalanche patterns change with the angular variation of the in-plane component of external magnetic field. When the in-plane magnetic field component is along the diagonal lines of the superconducting square, symmetric flux avalanche penetration patterns occur to the film.

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