Effect of angle deposition γ on the structural, optical and electrical properties of copper oxide zigzag (+γ, −γ) nanostructures elaborated by glancing angle deposition

Abstract

In this work, Cu x O thin films were obtained by air annealing of copper thin films deposited on glass substrates using thermal evaporation method by Glancing Angle Deposition "GLAD" technique. The copper was sculptured into a zigzag shape, which presents two columns with inclined angles + and-where is the deposition angle between the incident flux and the substrate normal. Morphological, structural, optical and electrical properties of the obtained thin films were investigated using X-ray diffraction (XRD), UV-Vis-NIR Spectroscopy and electrical resistivity measurements. The XRD patterns revealed that thin films deposited at different incident angles are mainly crystallized in Cu 2 O cubic phase characterized by the preferential orientation along (111) plane. The optical parameters were calculated from the analysis of the transmittance and reflectance spectra in the wavelength range 300-1800 nm. Theabsorptioncoefficient exceeds 10 5 cm-1 in the visible and NIR spectral ranges. Direct band gap energy increases from 2 to 2.54 eV with deposition angle. The in-plane birefringence and the anisotropic resistivity of the Cu 2 O films were also studied. Their maxima were obtained at incident flux angle of = 60°. Therefore, the GLAD technique is a promising way to create zigzag nanostructures with enhanced anisotropic properties.

In-Depth Study of Chemically Electrodeposited Cuprous Oxide (Cu2O) thin Films on ITO Glass

“…To evaluate the influence of the pH on the Cu2O electrodeposition, we characterized the electrodeposited Cu2O nanostructures by XRD. Figure 3 shows that the resulting materials exhibit 5 narrow and sharp peaks at 2θ values of 29.56°, 36.47°, 42.40°, 61.39°, and 73.57°, corresponding to (110), ( 111), ( 200), (220), and (311) planes, respectively, thus confirming the successful synthesis of a cubic phase crystal form of Cu2O which is in perfect agreement with JCPDS card No 01-078-2076 [33,34]. No corresponding peak to copper oxide or metallic copper peak is observed.…”

“…The structural characterizations of the electrodeposited Cu2O nanostructures at different applied potentials are presented in Figure 7. XRD peaks of the electrodeposited Cu2O films are assigned to the cubic phase with miller indices (110), ( 311), ( 200), (220), and (111) planes, respectively (JCPDS card N°: 01-078-2076) [51,52]. These peaks are narrow and sharp indicating that Cu2O films presented a good crystalline, and their intensity increases as the deposition potential increases.…”

GLAD Magnetron Sputtered Ultra-Thin Copper Oxide Films for Gas-Sensing Application

“…The obtained results were consistent with the results of other researchers. In [50], Chaffar Akkari et al described the fabrication of CuO x films on glass substrate by air annealing copper thin films deposited by thermal evaporation method using the GLAD technique. In this work, the morphological, structural, optical, and electrical properties were measured.…”

Impedance spectroscopy characterization of anisotropic nano-sculptured copper oxide Cu2O thin films for optoelectronic applications

“…Most cases of elaboration of such films are by vacuum thermal evaporation, sputtering, or e-beam. In previous works, it has been shown that the GLAD technique is able to create optical, electrical or magnetic anisotropy because of the highly oriented nanostructures [23][24][25][26][27][28].…”