Effect of angle of deposition on the Fractal properties of ZnO thin film surface

Yadav, R. P.; Agarwal, D. C.; Kumar, Manvendra; Rajput, Parasmani; Tomar, Dheeraj S.; Pandey, S. N.; Priya, Pradip Kumar; Mittal, Ashok

doi:10.1016/j.apsusc.2017.04.098

Cited by 37 publications

(8 citation statements)

References 37 publications

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“…The fractal dimension values generally range from two to three and are directly related to the surface complexity. For smooth surfaces, the values will be closer to two and increase to three when the roughness is increased [31]. For this reason, the HT process influenced the Df values to approach two, indicating that the surfaces tended to become less rough.…”

Section: Sem Analysismentioning

confidence: 97%

Poly(o-methoxyaniline) Chain Degradation Based on a Heat Treatment (HT) Process: Combined Experimental and Theoretical Evaluation

et al. 2022

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Poly(o-methoxyaniline) emeraldine-salt form (ES-POMA) was chemically synthesized using hydrochloric acid and subjected to a heat treatment (HT) process for 1 h at 100 °C (TT100) and 200 °C (TT200). The HT process promoted a progressive decrease in crystallinity. The Le Bail method revealed a decomposition from tetrameric to trimeric-folded chains after the HT process. The unheated POMA-ES presented a globular vesicular morphology with varied micrometric sizes. The heat treatment promoted a reduction in these globular structures, increasing the non-crystalline phase. The boundary length (S) and connectivity/Euler feature (χ) parameters were calculated from the SEM images, revealing that ES-POMA presented a wide distribution of heights. The TT100 and TT200 presented a narrow boundary distribution, suggesting smoother surfaces with smaller height variations. The UV-VIS analysis revealed that the transition at 343 nm (nonlocal π → π*) was more intense in the TT200 due to the electronic delocalization, which resulted from the reduced polymer chain caused by the HT process. In addition to the loss of conjugation, counter ion withdrawal reduced the ion-chain interaction, decreasing the local electron density. This result shows the influence of the chlorine counter ions on the peaks position related to the HOMO → LUMO transition, since the π → polaron transition occurs due to the creation of the energy states due to the presence of counter ions. Finally, the electrical conductivity decreased after the HT process from 1.4 × 10−4 S.cm−1 to 2.4 × 10−6 S.cm−1 as result of the polymer deprotonation/degradation. Thus, this paper proposed a systematic evaluation of the POMA molecular structure and crystallite size and shape after heat treatment.

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Section: Sem Analysismentioning

confidence: 97%

Poly(o-methoxyaniline) Chain Degradation Based on a Heat Treatment (HT) Process: Combined Experimental and Theoretical Evaluation

et al. 2022

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“…(3) When 0 < H < 0.5, there is only negative correlation in the time series, showing an anti-persistent state [91], i.e., the time series is increasing (decreasing) in a certain time period, and then decreasing (increasing) in the next time period.…”

Section: Fractal Study Of Various Thin Filmsmentioning

confidence: 99%

“…Talu S. et al [32] 2016 Co/CP/X Electrochemistry SEM Feng F. et al [76] 2017 MgO EPSAD AFM Nasehnejad M. et al [81] 2017 silver electrodeposition sputtering AFM Soumya S. et al [43] 2017 ZnS PLD AFM Yadav R. P. et al [91] 2017 ZnO atom beam sputtering AFM Talu S. et al [73] 2017 Ag-Cu magnetron sputtering AFM Talu S. et al [142] 2017 carbon-nickel magnetron sputtering AFM Talu S. et al [165] 2017 contact lenses polished AFM Talu S. et al [143] 2017 filler nanoparticles spin-coating AFM Talu S. et al [144] 2017 Ni NPs@a-C CVD AFM Sani Z. K. et al [145] 2017 [155] 2019 C8-BTBT meniscus-guided coating OM Ghosh K. et al [86] 2019 ZnO sol-gel spin-coating AFM Mwema F. M. et al [156] 2019 Al magnetron sputtering AFM Pedro, G.d.C. et al [157] 2019 chlorophyll (Chl) casting & drying OM Talu S. et al [63] 2020 Ag-Cu magnetron sputtering AFM Jafari A. et al [158] 2020 copper oxide magnetron sputtering AFM Yildiz K. et al [159] 2020 montmorillonite cast OM Aminirastabi H. et al [160] 2020 BaTiO 3 sol-gel -Yang L. et al [161] 2021 Pt electroless plating SEM Jiang Y. et al [163] 2021 MoS 2 CVD OM Jiang H. et al [15] 2021 metallic glass ion beam deposition STEM Romaguera Y. et al [164] 2021 GdMnO 3 spin-coating AFM…”

Section: Abbreviations Appendix Amentioning

confidence: 99%

Fractal Analysis on Surface Topography of Thin Films: A Review

et al. 2022

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The topographies of various surfaces have been studied in many fields due to the significant influence that surfaces have on the practical performance of a given sample. A comprehensive evaluation requires the assistance of fractal analysis, which is of significant importance for modern science and technology. Due to the deep insights of fractal theory, fractal analysis on surface topographies has been widely applied and recommended. In this paper, the remarkable uprising in recent decades of fractal analysis on the surfaces of thin films, an essential domain of surface engineering, is reviewed. By summarizing the methods used to calculate fractal dimension and the deposition techniques of thin films, the results and trends of fractal analysis are associated with the microstructure, deposition parameters, etc. and this contributes profoundly to exploring the mechanism of film growth under different conditions. Choosing appropriate methods of surface characterization and calculation methods to study diverse surfaces is the main challenge of current research on thin film surface topography by using fractal theory. Prospective developing trends are proposed based on the data extraction and statistics of the published literature in this field.

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“…To study the scaling behavior during deposition of films, fractal analysis on field emission scanning electron microscope (FESEM) and atomic force microscope images can be used . Through the fractal technique, information regarding lateral development of the films and multifractal characteristics of the surface structures can be obtained .…”

Section: Introductionmentioning

confidence: 99%

Micromorphology and nanomechanical characteristics of sputtered aluminum thin films

Mwema

Akinlabi

Oladijo

2020

Materialwissenschaft Werkst

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Micromorphology and nanoindentation properties of sputtered aluminum thin films are presented. The field emission scanning electron microscope, atomic force microscopy (AFM) and nanoindentation results are presented for films prepared at a substrate temperature ranging between 44.5°C and 100°C. A multifractal approach on the microstructure is presented to comprehend the micromorphology of the films. The roughness decreases, whereas fractal dimension increases as the temperature increases. The hardness and Young's modulus do not exhibit any predictable trend. Hardness and Young's modulus exhibit a linear relationship. Figure 7. Nanoindentation characteristics of aluminum thin films at various temperatures.Figure 8. Youngs Modulus against hardness at various substrate temperature.Micromorphology and nanomechanical characteristics of sputtered aluminum thin films Materialwiss. Werkstofftech. 2020, 51, 787-791

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Effect of angle of deposition on the Fractal properties of ZnO thin film surface

Cited by 37 publications

References 37 publications

Poly(o-methoxyaniline) Chain Degradation Based on a Heat Treatment (HT) Process: Combined Experimental and Theoretical Evaluation

Poly(o-methoxyaniline) Chain Degradation Based on a Heat Treatment (HT) Process: Combined Experimental and Theoretical Evaluation

Fractal Analysis on Surface Topography of Thin Films: A Review

Micromorphology and nanomechanical characteristics of sputtered aluminum thin films

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