2009
DOI: 10.1016/j.apsusc.2009.06.020
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Effect of annealing on electrical resistivity of rf-magnetron sputtered nanostructured SnO2 thin films

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Cited by 90 publications
(37 citation statements)
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“…The roughness of the sample not only describes the light scattering but also gives an idea about the quality of the surface under investigation. Khan et al [23] have reported a kind of inverse trend of resistivity with roughness of nanostructered SnO 2 thin films. In fact, we have observed a similar behavior in the present sol-gel derived CdO-ZnO thin films.…”
Section: Structural and Morphological Propertiesmentioning
confidence: 98%
“…The roughness of the sample not only describes the light scattering but also gives an idea about the quality of the surface under investigation. Khan et al [23] have reported a kind of inverse trend of resistivity with roughness of nanostructered SnO 2 thin films. In fact, we have observed a similar behavior in the present sol-gel derived CdO-ZnO thin films.…”
Section: Structural and Morphological Propertiesmentioning
confidence: 98%
“…It is known that the electrical contact between the crystalline domains is not perfect in many oxide films [8], carrier scattering at grain boundaries further reduces the conductivity of these materials. Numerous studies [9][10][11] of SnO 2 thin films have been done to improve their electrical conductivity for utilizing them as transparent electrodes. However, underlying influences of defects and dopants on the carrier transportation in SnO 2 based thin films are not yet well understood.…”
Section: Introductionmentioning
confidence: 99%
“…3b and Fig. S3 show that the grains are uniformly distributed within the scanning area, and the film is smooth with a root mean square (RMS) surface roughness of~14.9 nm in an area of 2 μm × 2 μm, smaller than 25.76 nm reported in high-temperature processed films with large particle size [35]. This surface char- acteristic is important for SnO2's applications as ESL.…”
Section: Resultsmentioning
confidence: 91%