2008
DOI: 10.1088/0022-3727/41/16/165502
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Effect of annealing on the structural and optical properties of indium-diffused Cd0.7Zn0.3Se thin films

Abstract: Cadmium zinc-selenide (Cd0.7Zn0.3Se) thin films were deposited on the ITO substrate using chemical bath deposition techniques by optimizing the deposition parameters. The as-deposited films were annealed in air at 200, 300 and 400 °C for 1 h. The composition, surface morphology and structural properties of the as-deposited and annealed Cd0.7Zn0.3Se thin films were studied using x-ray photoelectron spectroscopy, scanning electron microscopy and x-ray diffraction techniques. The as-deposited films exhibited the … Show more

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Cited by 19 publications
(12 citation statements)
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“…Additionally, the diffraction peak observed at 2Â ≈ 27.72 • becomes very strong indicating that the structure of the films was preferentially oriented along the crystallographic plane (1 1 1) as the annealing temperature increases. The annealing effects on the structure properties of the as deposited films agree with the thermal effects reported for other materials [32,33]. …”
Section: Structural Characterizationsupporting
confidence: 84%
“…Additionally, the diffraction peak observed at 2Â ≈ 27.72 • becomes very strong indicating that the structure of the films was preferentially oriented along the crystallographic plane (1 1 1) as the annealing temperature increases. The annealing effects on the structure properties of the as deposited films agree with the thermal effects reported for other materials [32,33]. …”
Section: Structural Characterizationsupporting
confidence: 84%
“…Initially ampoule of CdSe were formed, then mixed Zinc core material in given proportion and fused to very high temperature in quartz tube for uniform mixing of Zn, and CdSe to form ternary Zn 0.75 Cd 0.25 Se compound. Thin films of ZnxCd1-xSe were prepared by vacuum evaporation technique on glass substrate [8]. Then Zn 0.75 Cd 0.25 Se compound was grinded to get fine powder and placed in molybdenum boat for evaporation.…”
Section: Experimental a Thin Film Depositionmentioning
confidence: 99%
“…The low tension (LT) supply for evaporation source is obtained from a 230V input transformer by means of parallel connections in the secondary side of the transformer [10]. The Zn 0.75 Cd 0.25 Se samples of different thicknesses (1000 Å and 2500 Å) were deposited under almost same environment [8,11]. The thickness monitor model no.…”
Section: Experimental a Thin Film Depositionmentioning
confidence: 99%
“…The relation between the absorption coefficient (α) and the incident photon energy (hν) is expressed as: αhν = A (hν -E g ) n where Eg is optical bandgap, A is a constant, n is a factor that determines the nature of transition. [16] Fig. 6 shows a graph of (αhν) 2 against (hν) for various x-parameters.…”
Section: Optical Propertiesmentioning
confidence: 99%