2014
DOI: 10.1063/1.4891177
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Effect of annealing on the growth dynamics of ZnPc LB thin film and its surface morphology

Abstract: The ZnPc molecules in the thin film prepared by Langmuir-Blodgett (LB) process in asdeposited state has been found to have an edge on orientation with average tilt angle of 64.3 ° as confirmed from the Pressure-Area (π-A) isotherm and X-ray diffraction (XRD) study. The ZnPc LB thin film has been observed to have abnormal growth mode at higher annealing temperature and it is mainly driven by minimization of surface free energy which lead to large increase in crystallinity of the film. Kinetically favored orient… Show more

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Cited by 8 publications
(9 citation statements)
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“…The grain size distribution of the annealed ZnPc thin lm remains monomodal up to 200 C along with a continuous increase in ZnPc grains size, as shown in our earlier study, 42 which conrms that the ZnPc thin lms have a normal growth of grains until this annealing temperature. Similarly, the grain size distribution obtained for the ZnPc thin lm annealed at 290 C is found to be abnormal (Fig.…”
Section: X-ray Photoelectron Spectroscopysupporting
confidence: 82%
See 1 more Smart Citation
“…The grain size distribution of the annealed ZnPc thin lm remains monomodal up to 200 C along with a continuous increase in ZnPc grains size, as shown in our earlier study, 42 which conrms that the ZnPc thin lms have a normal growth of grains until this annealing temperature. Similarly, the grain size distribution obtained for the ZnPc thin lm annealed at 290 C is found to be abnormal (Fig.…”
Section: X-ray Photoelectron Spectroscopysupporting
confidence: 82%
“…The ZnPc nanoparticles start merging with each other showing normal growth to form bigger spherical nanoparticles until 200 C, as described in our earlier study. 42 FESEM image of ZnPc thin lm annealed at 290 C (Fig. 7(c)) shows the formation of elongated nanorod-like structure over the substrate surface, which is related to the secondary grain growth process of the ZnPc nanoparticles at higher annealing temperature.…”
Section: X-ray Photoelectron Spectroscopymentioning
confidence: 97%
“…To gain further insight into the surface morphology, thin films of PEHVBS polymers were prepared from a toluene solution. The surface morphologies of the prepared films were observed by AFM ( Figure ), which has been an invaluable tool in the recent years for investigating phase separation behavior of block copolymers as a result of its cheap sample‐preparation cost and absence of staining . The homogeneous surface morphology of the cast PEHV film is shown in Figure a.…”
Section: Resultsmentioning
confidence: 99%
“…49−57 Presently, in all substrates, the diffraction peak of CuPc has been obtained at 2θ = 6.7°having an interplanar spacing of ∼0.11 nm and is recognized as (200) lattice planes of the β phase of the CuPc crystal structure. 37,57 The crystalline domain size of CuPc crystals on both substrates has been calculated using Debye−Scherrer's formula 58 as D 0.9 cos…”
Section: Fabrication and Memorymentioning
confidence: 99%