2012
DOI: 10.3923/jas.2012.1706.1709
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Effect of Annealing Temperatures on the Structural, Optical Properties of Tungsten Selenide Thin Films

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Cited by 7 publications
(5 citation statements)
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“…These values are in good agreement with the earlier reported value (Hankare et al 2009aGayathri et al 2012;Sathe et al 2010). The average crystallite size was calculated using Scherrer formula:…”
Section: Structural Characterizationsupporting
confidence: 79%
See 1 more Smart Citation
“…These values are in good agreement with the earlier reported value (Hankare et al 2009aGayathri et al 2012;Sathe et al 2010). The average crystallite size was calculated using Scherrer formula:…”
Section: Structural Characterizationsupporting
confidence: 79%
“…The XRD pattern of WSe 2 thin film is shown in Fig. 1 (Gawale et al 2010;Delphine et al 2003;Devadasan et al 2003;Hankare et al 2009aHankare et al , 2010Gayathri et al 2012;Sathe et al 2010).…”
Section: Structural Characterizationmentioning
confidence: 99%
“…Annealing shifted the transmittance of thin films to higher photon wavelength. Higher transmittance within the visible region in annealing was realized, probably due to reduction in dislocation densities (Gayathri et al, 2012). This is depicted in Figure 5.…”
Section: Analysis Of Elemental Composition Of Tio2-cu Materialsmentioning
confidence: 80%
“…This is essentially due to the fact that thermal annealing (TA) results into structural rearrangement and microstructure formation that could significantly alter the macroscopic polarizability. Gayathri et al [27] reported that the TA process in W Se 2 films substantially modifies the linear optical properties. This is essentially a consequence of bandgap tailoring due to structural rearrangement.…”
Section: Introductionmentioning
confidence: 99%