2014
DOI: 10.1016/j.spmi.2014.09.024
|View full text |Cite
|
Sign up to set email alerts
|

Effect of antimony doping on the structural, optical and electrical properties of SnO2 thin films prepared by spray ultrasonic

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

3
8
1

Year Published

2015
2015
2024
2024

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 31 publications
(12 citation statements)
references
References 28 publications
3
8
1
Order By: Relevance
“…The overall strain observed experimentally involves some competition between the above mechanisms, and it has been found that tensile strain predominates for both ATO and AZO thin films when the preferred orientation and the crystallite size grow. Analogous tensile strain has been reported for other ATO and AZO layers [21,36,37] and also a similar trend toward tensile increment when the film thickness increases has been found in other sputtered materials [35]. The surface morphology has been explored by AFM measurements and some representative images of the layers with various thicknesses are shown in Fig.…”
Section: Resultssupporting
confidence: 76%
“…The overall strain observed experimentally involves some competition between the above mechanisms, and it has been found that tensile strain predominates for both ATO and AZO thin films when the preferred orientation and the crystallite size grow. Analogous tensile strain has been reported for other ATO and AZO layers [21,36,37] and also a similar trend toward tensile increment when the film thickness increases has been found in other sputtered materials [35]. The surface morphology has been explored by AFM measurements and some representative images of the layers with various thicknesses are shown in Fig.…”
Section: Resultssupporting
confidence: 76%
“…The crystallite sizes of different doping ratios samples were estimated from the broadening of the diffraction peak of the (110) plane using Scherrer formula. [15] The formula can be written as:…”
Section: Resultsmentioning
confidence: 99%
“…The crystallite sizes of different doping ratios samples were estimated from the broadening of the diffraction peak of the (110) plane using Scherrer formula. [ 15 ] The formula can be written as: D0.33embadbreak=κ0.33emλβ0.33emcosθ0.33em$$\begin{equation}D\ = \frac{{\kappa \ \lambda }}{{\beta \ cos\theta }}\ \end{equation}$$where D means crystallite size, β is full width at half maximum (FWHM) of diffraction peaks, κ = 0.89 and λ = 0.154 nm, θ in the above formula represent the X‐ray wavelength and Bragg angle separately. The calculated results of three samples with different doping ratios are: 29.59, 20.67, and 20.43 nm.…”
Section: Resultsmentioning
confidence: 99%
“…[23][24][25] In order to increase the conductivity and achieve a better performance, a donor type dopant may be required. Since the deposition method significantly changes the thin film properties, researchers have explored various techniques such as sputtering, [26][27][28][29][30][31] PLD, 32 CVD, 33,34 hydrolysis, 35 wet chemical deposition, 36 sol-gel methods, 37 hydrothermal methods [38][39][40] and spray pyrolysis [41][42][43][44][45][46][47][48] for the deposition of the Sb-doped SnO 2 (ATO) film. Even though several reports exist on Sb-doped SnO 2 thin films, the size of the film deposited using spray pyrolysis is generally limited to a very small area.…”
Section: Introductionmentioning
confidence: 99%