2004
DOI: 10.1117/12.535623
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Effect of background exposure dose upon line-edge roughness (LER)

Abstract: LER is found to correlate strongest with the background, or flare, portion of the lithographic aerial image contrast, when compared with the image slope and "standard" (max -min)/(max + min) contrast. A large pool of collected data and rigorous statistical analysis of variance conclude with far greater than 99% confidence that as any of these measures of aerial image profile degrade, LER increases. However, the relation between background exposure and LER is by far the most significant.

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