Transmission X-ray microscopy is utilized to monitor, in real time, the behavior of the PbSO 4 film that is formed on Pb in H 2 SO 4 . Images collected from the synchrotron x-rays are coupled with voltammetric data to study the initial formation, the resulting passivation, and the subsequent reduction of the film. It is concluded with support from quartz-crystal-microbalance experiments that the initial formation of PbSO 4 crystals occurs as a result of acidic corrosion. In addition, the film is shown to coalesce during the early stages of galvanostatic oxidation and to passivate as a result of morphological changes in the existing film. Finally, it is observed that the passivation process results in the formation of large PbSO 4 crystals with low area-to-volume ratios, which are difficult to reduce under both galvanostatic and potentiostatic conditions.