Abstract:Silicon drift detectors (SDDs) are widely applied for x-ray detection due to their remarkable energy resolution. The main contribution to energy resolution is the electrical noise of measurement system. In addition, other factors, including imperfect charge collection and ballistic deficit, can deteriorate the energy resolution. Those factors are closely related to the bias conditions of the device. However, the effect of bias conditions on device energy resolution has rarely been reported, primarily because t… Show more
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