“…However, the p-type doped samples with the lower ratio of etching solution (i.e., p + ) and p, see Table 1) show a relatively intense deep at the Si edge which might indicate higher crystalline Si content, compared to the p-type sample etched in the higher oxidizing agent solution (i.e., p 0 ). This agrees with higher oxidation rate via this solution and higher porosity of samples, as reported previously [15]. Furthermore, the n-type sample shows a relatively consistent features with its surface counterpart, though with a slight shift of the Si edge.…”