Effect of charge transfer on electrostatic adhesive force under different conditions of particle charge and external electric field

Abstract

The electrostatics of charged particles are utilized for various applications. This paper presents an analysis of the electric field and electrostatic adhesive force on a charged dielectric particle lying on a conducting plane under an externally applied electric field. The purpose of the analysis is to quantitatively investigate the force variation when there is charge transfer between the particle and the conducting plane. We treat the distribution of charges as either uniform on the particle or partially on the lower half. The transferred charge density is assumed to be dependent on the applied electric field. The results show that the electric field is very strong near the contact point, where the charge transfer may occur. Without the charge transfer, the electrostatic adhesive force on a negatively charged particle increases when the applied field is in the upward direction from the plane. However, in the presence of charge transfer, the force may vary only slightly with the applied field or even show a reverse tendency if the transfer charge density depends significantly on the applied field.

Effect of applied low-voltage spatial electric field on the corrosion behaviour of copper in 3.5 wt-% NaCl solution

“…According to Zhao et al's report on the corrosion behaviour of copper in chlorine-containing media, it was explained from the perspective of molecular dynamics that the copper surface became rough over time and copper and chlorine combined in the rough regions [34]. Besides, Boonchai et al studied the effect of charge transfer under applied electric field on the electrostatic adhesion force of charged particles on a conductive plane and found that if the degree of charge transfer changes significantly with the applied field, the external electric field may weaken the electrostatic adhesion [35]. According to the value of the R ct from Table 2 in EIS tests, the increase in the SEF field strength significantly reduced the value of R ct , which indicated to a certain extent that the charge transfer was dependent on the external SEF.…”