2001
DOI: 10.1134/1.1393017
|View full text |Cite
|
Sign up to set email alerts
|

Effect of deviations from stoichiometry on electrical conductivity and photoconductivity of CuInSe2 crystals

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
5
0

Year Published

2006
2006
2025
2025

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 10 publications
(5 citation statements)
references
References 4 publications
0
5
0
Order By: Relevance
“…These small deviations in composition can produce large changes in the electrical properties, as well as in the band gap and electronic band structure . Moreover, Cu rich films are found to mostly exhibit p-type conductivity, but as the films become In-rich, a conversion to n-type conductivity occurs . Some of these In-rich structures likely result from the reduced formation energies of cation vacancy sites in the chalcopyrite phase and others as the result of energetically stabilized defect pairs; thus, defects are an important topic in the Cu−In−Se system. , At present, there is no agreement between the numerous studies of these In-rich materials on the phase boundaries’ compositions, on the various phases that lie between CuInSe 2 and CuIn 5 Se 8 , or on their crystal structures …”
Section: Crystal Phases and Stoichiometriesmentioning
confidence: 99%
“…These small deviations in composition can produce large changes in the electrical properties, as well as in the band gap and electronic band structure . Moreover, Cu rich films are found to mostly exhibit p-type conductivity, but as the films become In-rich, a conversion to n-type conductivity occurs . Some of these In-rich structures likely result from the reduced formation energies of cation vacancy sites in the chalcopyrite phase and others as the result of energetically stabilized defect pairs; thus, defects are an important topic in the Cu−In−Se system. , At present, there is no agreement between the numerous studies of these In-rich materials on the phase boundaries’ compositions, on the various phases that lie between CuInSe 2 and CuIn 5 Se 8 , or on their crystal structures …”
Section: Crystal Phases and Stoichiometriesmentioning
confidence: 99%
“…are Cu-deficient, the concentration of antisite defects CuIn decreases with increasing x. CuIn substitutional defects create acceptor levels located 0.05-0.08 eV above the valence band [15,19]. In Fig.…”
Section: Temperature Dependent Conductivitymentioning
confidence: 94%
“…This is evidenced by the strong dependence of Nf values (and thus the concentration of VCu) on the composition of material. According to[19], in CuInSe2 compounds VCu create acceptor levels located 0.7 eV above the valence band. By growing temperature above 110 K, the Fermi level moves up, approaching the donor levels having activation energies of ~0.018 eV and ~0.04 eV.…”
mentioning
confidence: 99%
See 1 more Smart Citation
“…This trend is valid at all temperatures between 300 and 773 K, suggesting the thermal stability of the microstructure of (1 À x)Cu 2 Se/(x)CuInSe 2 composites within this temperature window. While the initial drop in the electrical conductivity of samples with x # 45% can be anticipated from the incorporation of a poorly conductive secondary phase within a highly conductive matrix, 24,[32][33][34][35][36] the observed sudden large increase for the 48 mol% and 50 mol% CuInSe 2 , suggests either the formation of a new phase, such as Cu 3 InSe 3 , with a different molecular structure and thus different electronic band structure, or a sharp alteration of the electronic band structures of both Cu 2 Se and CuInSe 2 phases, owing to their multiscale hierarchical integration within the (1 À x)Cu 2 Se/(x)CuInSe 2 composites. The former hypothesis can be ruled out, because the XRD, SEM and TEM only show the coexistence of Cu 2 Se and CuInSe 2 phases in the sample with x ¼ 50% and the Cu 3 InSe 3 phase is absent below 1180 K from the Cu 2 Se-CuInSe 2 pseudo binary phase diagram (Fig.…”
Section: Electronic Propertiesmentioning
confidence: 99%