“…Quantitative measurement of surface topography can be obtained using profilometry (Arabaci et al, ; Watanabe et al, ); or qualitative methods, such as scanning electron microscopy (Naseri et al, 2017; Zare et al 2018, Antonson et al, 2011, Erdemir et al, 2012) and atomic force microscopy (AFM) (Salerno et al, , Lainović, Blažić, Vilotić, & Kakaš, , Ţălu , Lainović et al, ]. In these studies, average surface roughness ( S a ) and root mean square ( S q ) were used to quantify morphological changes (Giacomelli et al, ; Janus, Fauxpoint, Arntz, Pelletier, & Etienne, ; Kakaboura, Fragouli, Rahiotis, & Silikas, ).…”