2015
DOI: 10.1016/j.rinp.2015.10.005
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Effect of different dopants Ba and Ag on the properties of SrTiO 3 nanopowders

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Cited by 15 publications
(4 citation statements)
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“…Heat treatment of as-prepared dark and white powder at 850 • C results in crystalline structure formation. [20][21][22] B: Urea metal cation ratio (U:MC = 0.8 and 0.7): The cations of titanium and silicon were added to urea and distilled water as the base solution. The heating process accompanied with bubbles formation due to the removal of volatile species.…”
Section: Methodsmentioning
confidence: 99%
“…Heat treatment of as-prepared dark and white powder at 850 • C results in crystalline structure formation. [20][21][22] B: Urea metal cation ratio (U:MC = 0.8 and 0.7): The cations of titanium and silicon were added to urea and distilled water as the base solution. The heating process accompanied with bubbles formation due to the removal of volatile species.…”
Section: Methodsmentioning
confidence: 99%
“…The wavelength intersection between 𝑛(𝜔)and 𝑘(𝜔) can be determined from the FTIR spectral analysis of TO and LO [14]. TO has a lower wavelength than LO because of the intersection of the optics with the crystal lattice.…”
Section: 𝑁 ̃(𝜔) = 𝑛(𝜔) + 𝑘(𝜔)mentioning
confidence: 99%
“…The wavenumber data for the intersection of the real and imaginary parts of the dielectric functions are presented in Table 2. The real part (ε1) represents the energy stored in the material, whereas the imaginary part (ε2) represents the energy dissipated as heat [14]. The real and imaginary dielectric intensities increased with the addition of Cu dopants.…”
Section: Figure 1 Ftir Spectrum Of Srtio3 Films Doped With Cupricmentioning
confidence: 99%
“…Found the carriers concentration of charge are holes, p-type of Sr1-xBxTiO3 thin films at doping ratio (x=2, 4, 6 and 8)%, it is seen that the carriers concentration are increased from (6.776×10 9 -3.888×10 11 ) cm -3 as the B content are increasing at x=(0.00-0.08). The increasing is attributed to increase the charge carrier [26][27][28]. The carrier concentration (n) is related to the Hall coefficient (RH) as expressed by the Eq.…”
Section: Hall Effect Measurementmentioning
confidence: 99%