β-(Al
x
Ga1–x
)2O3 films were deposited on
c-plane sapphire substrates by metal–organic chemical vapor
deposition. Triethylgallium (TEGa), trimethylaluminum (TMAl), and
O2 were used as Ga, Al, and O sources, respectively. (−201),
(−402), and (−603) diffraction peaks of β-(Al
x
Ga1–x
)2O3 films were observed. The X-ray diffraction peaks
shifted to larger diffraction angles and were broadened with the increasing
TMAl flow rate or the TMAl/(TMAl + TEGa) flow rate ratio, and the
optical band gap was effectively improved. The β-(Al
x
Ga1–x
)2O3 films deposited under different temperatures were further
investigated. At 600 °C, Al atoms were more easily incorporated
into the crystal lattice, and the optical band gap was improved to
5.73 eV. At 800 and 900 °C, the β-(Al
x
Ga1–x
)2O3 films existed as polycrystalline materials.