Abstract:In this paper, the effects of electron beam irradiation on the CdTe thin films are studied. The CdTe thin films are characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and contact angle measurements for different bath concentration. The thin film layers are subjected to irradiation of 6 MeV electrons. Finally the effect of irradiation is correlated to crystal size, grain size and contact angle measurements of the CdTe thin films
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