Effect of Electron Source to Energy Resolution in Electron Velocity Analysis — Interpretation of Boersch Effect

Ichinokawa, T.

doi:10.1007/978-3-662-12108-5_48

VTH International Congress on X-Ray Optics and Microanalysis / v. Internationaler Kongreß Für Röntgenoptik Und Mikroanalyse / V 1969

DOI: 10.1007/978-3-662-12108-5_48

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Effect of Electron Source to Energy Resolution in Electron Velocity Analysis — Interpretation of Boersch Effect

T. Ichinokawa¹

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Effect of Electron Source to Energy Resolution in Electron Velocity Analysis — Interpretation of Boersch Effect

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References 7 publications

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