1974
DOI: 10.1016/0029-554x(74)90762-9
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Effect of electrons and X-rays on alpha-particle registration in T-Cellit detector

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Cited by 19 publications
(3 citation statements)
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“…Characteristics of solid state nuclear track detectors were studied by many authers. It is well known that, track size, bulk etch rate and track etch rate are affected by exposing detectors to several types of radiations such as, X-ray, γ-rays, UV and alpha particles [1,2,3,4,5,6]. The two main changes noticed in polymers are [7] : 1) Chain cross linking resulting in an increases of molecular weight because of a large number of free radicals produced in polymer.…”
Section: Introductionmentioning
confidence: 99%
“…Characteristics of solid state nuclear track detectors were studied by many authers. It is well known that, track size, bulk etch rate and track etch rate are affected by exposing detectors to several types of radiations such as, X-ray, γ-rays, UV and alpha particles [1,2,3,4,5,6]. The two main changes noticed in polymers are [7] : 1) Chain cross linking resulting in an increases of molecular weight because of a large number of free radicals produced in polymer.…”
Section: Introductionmentioning
confidence: 99%
“…The major facets of research work in this area are materials development, track stability, etching technology, and improved readout techniques. Common materials used as the track detector include cellulose acetates (146)(147)(148)(149), and cellulose nitrate (150-152). Some of the less common substrates that have been employed are celluloid (153), mica and quartz (154), glass (155), and Kodak Special Film LR115 (156).…”
mentioning
confidence: 99%
“…An increase of bulk etching rate has been recently reported as the most striking change among macroscopic properties(8)" (12). We investigated irradiation effects of low LET radiation such as 7-rays or electrons, since few experimental data on irradiation effects with special regard to the registration mechanism have been reported up to OW(^)('^).…”
Section: Introductionmentioning
confidence: 99%