Effect of Gas Environment on Electrophysical Parameters of Heterojunctions on the Basis of Schottky Barrier with Nano-Structured (95% In2O3 + 5% SnO2) Oxide Films

Abstract

Electrophysical characteristics of gas-sensitive Ni -(95% In2O3 + 5% SnO2)p-Si heterojunctions have been studied experimentally. The analysis of their current-voltage characteristics (CVCs) registered in various gas environments reveals a significant increase of the reverse current through specimens in the atmosphere of ethanol or isopropyl vapor. Various mechanisms of current flow through the heterojunction are considered to explain this phenomenon. Variations in the potential barrier height under the action of image forces are demonstrated to play a significant role in shifts of the reverse CVC branches of examined specimens. The image force changes are explained by the influence of the adsorbate on the dielectric permittivity of oxide films.