2006
DOI: 10.1109/lmwc.2006.873454
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Effect of gate poly-silicon depletion on MOSFET input impedance

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“…3. The estimated Z gs (magnitude of complex impedance) of our low-impedance MOSFETs is below 1 k around 0.2 THz, while the conventional nanoscale MOSFETs with smaller device dimensions (L = W = 45, 65, 130 nm, T ox = 2.2 ∼ 3.2 nm [16]) show high Z gs above 1 k , which is reasonable range when compared with low-Z gs level in the multi-fingered (finger number NF > 10) RF MOSFETs [17] and single-fingered 130-nm MOSFETs with larger widths [18].…”
Section: Device Fabrication and Thz Detection Resultsmentioning
confidence: 76%
“…3. The estimated Z gs (magnitude of complex impedance) of our low-impedance MOSFETs is below 1 k around 0.2 THz, while the conventional nanoscale MOSFETs with smaller device dimensions (L = W = 45, 65, 130 nm, T ox = 2.2 ∼ 3.2 nm [16]) show high Z gs above 1 k , which is reasonable range when compared with low-Z gs level in the multi-fingered (finger number NF > 10) RF MOSFETs [17] and single-fingered 130-nm MOSFETs with larger widths [18].…”
Section: Device Fabrication and Thz Detection Resultsmentioning
confidence: 76%