“…Phase composition was analyzed by X‐ray diffraction (XRD, D/max 2200 PC, Rigaku, Tokyo, Japan) using Cu Ka radiation at the diffraction angles 2θ ranging from 10° to 90° with a scan speed of 4°/min. Some specimens and Si powders used as external standard were analyzed by XRD with a slow scan speed of 1°/min and a scan step of 0.02°, in order to perform Rietveld refinement by FullProf software and calculate the lattice strain by MDI Jade software (Version 6.5, Materials Data, Inc., USA) based on the Williamson–Hall (W‐H) equation:
44,45 where β hkl is the peak full width at half maximum intensity (FWHM) excluding the instrumental FWHM, D , k , λ , and ε are crystallite size, shape factor, the wavelength of CuK α1 radiation, and lattice strain, respectively. The phases were further identified by Raman spectroscopy (Renishaw‐InVia, Renishaw, UK) with the 532 nm argon laser.…”