“…[116][117][118][120][121][122] N. Sunthornpan et al investigated how the thickness of the Au seed layer affected the low-temperature crystallization process of Ge thin lms. 122 Au layers with variable thicknesses of 1 nm, 2.5 nm, 5 nm, 7.5 nm, and 10 nm were rst sputter-deposited on the Si substrates, followed by the amorphous Ge thin lms (30 nm) deposition also by the sputter deposition. Then, the as-obtained samples were annealed from 150 C to 200 C in order to realize the crystallization of deposited Ge thin lms.…”