2006
DOI: 10.1063/1.2170044
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Effect of grain size on the soft magnetic properties of FeCoV∕CoNbZr multilayers

Abstract: Articles you may be interested inImproving soft magnetic properties of nanometer CoNbZr films in gigahertz frequency range by electrical pulse annealing J. Appl. Phys. 113, 17A341 (2013); 10.1063/1.4800744 Microfluxgate sensor with amorphous cobalt (Co-Nb-Zr) soft magnetic core for electronic compass J. Appl. Phys. 99, 08M306 (2006); 10.1063/1.2172540 Magnetoresistance and performance of amorphous-Co Nb Zr ∕ Co ∕ Cu ∕ Co magnetic multilayers J. Appl. Phys. 99, 08T105 (2006); 10.1063/1.2171019 ( FeCo/Co-M ) n s… Show more

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Cited by 9 publications
(3 citation statements)
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“…35 The same FeCoV ferromagnet is also implemented in multilayer structures for applications in spintronics. 37,38,[65][66][67][68] In Sec. V A, a detailed investigation of the remagnetization process by polarized neutron reflectivity with polarization analysis is presented, confirming the previous investigations.…”
Section: Samplementioning
confidence: 99%
See 1 more Smart Citation
“…35 The same FeCoV ferromagnet is also implemented in multilayer structures for applications in spintronics. 37,38,[65][66][67][68] In Sec. V A, a detailed investigation of the remagnetization process by polarized neutron reflectivity with polarization analysis is presented, confirming the previous investigations.…”
Section: Samplementioning
confidence: 99%
“…36 All this, together with the high saturation magnetization of the ferromagnetic layers makes FeCoV an excellent candidate for high-frequency thin film read-head material. 37,38 In this supermirror, the lateral grain size increases with the layer thickness, 39 leading to an increase of the coercive field from the thinnest to the thickest layers. 34 The issue here is to figure out whether the evolution of the lateral grain size reflects itself in an evolution of the layer magnetization reversal mechanism and/or of the lateral magnetic correlations.…”
Section: Introductionmentioning
confidence: 99%
“…This measurement system consists in probing the ac magnetic susceptibility of a material in one direction while an external bias magnetic field is applied perpendicular to the measurement direction. Analysis of the TS in magnetic materials have demonstrated its potential and versatility to study singular magnetic properties of bulk [36][37][38], single crystals [39], thin films [40][41][42][43] and nanoparticles (NPs) systems [44][45][46][47][48]. TS measurement techniques developed up to date are based Introduction diode oscillator (TDO), the latter acting as an active device for losses compensation in the circuit.…”
Section: Introductionmentioning
confidence: 99%