The determination of the state of strain in implanted materials is a key issue in the study of their mechanical stability. Whereas this question is relatively easily solved in the case of single crystals, it remains a challenging task in the case of polycrystalline materials. In this paper, we take benefit of the intense and parallel beams provided by third generation synchrotron sources combined with a two-dimensional detection system to analyze individual grains in polycrystals, hence obtaining "single crystal-like" data. The feasibility of the approach is demonstrated with implanted UO 2 polycrystals where the in-depth strain profile is extracted for individual grains using numerical simulations of the diffracted signal. The influence of the implantation dose is precisely analyzed for several diffracting planes and grains. It is shown that, at low fluences, the development of strain is mainly