Effect of Impurity Segregation on Crystal Morphology of Y-Bar Synthetic Quartz

Iwasaki, Fumiko; Iwasaki, H.; Suzuki, Carlos K.

doi:10.1143/jjap.29.1139

Cited by 16 publications

(6 citation statements)

References 6 publications

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“…The main structural differences between these faces are the electrical polarity and the growth velocity. For a right-hand crystal, the growth velocity for +X-is about 2.5 times higher than for -X-face 1,4 . The slowest growth rate of the -X-face is probably connected with the capture of OH species during the hydrothermal growth.…”

Section: Segregation Of Al-and Oh-speciesmentioning

confidence: 87%

“…It is explained by the anisotropy of the growth velocities between the faces formed around the Z-axis. +X-faces growth 2.5 times faster than -X-faces and the growth velocity of mfaces is nearly zero 1,4 . m-faces appearing at the boundary between +X-growth sectors inhibit the progress of the growing layer.…”

Section: Dislocations and Growth Sectorsmentioning

confidence: 99%

“…The selective distribution of impurity-related point defects in growth sectors formed around the Y-axis is well known [2][3][4][5][6] . Similarly, the artificial smoky color due to ionizing irradiation is not uniformly distributed throughout the Y-axis.…”

Section: Segregation Of Al-and Oh-speciesmentioning

confidence: 99%

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Characterization of growth sectors in synthetic quartz grown from cylindrical seeds parallel to [0001] direction

et al. 2004

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In the present study, the morphology and the impurity distribution were investigated in growth sectors formed around the [0001] axis of synthetic quartz crystals. Plates containing cylindrical holes and cylindrical bars parallel to [0001] were prepared by ultrasonic machining and further used as seed-crystals. The hydrothermal growth of synthetic quartz was carried out in a commercial autoclave under NaOH solution during 50 days. The morphologies of crystals grown from cylindrical seeds were characterized by X-ray diffraction topography. For both types of crystals, +X- and X- growth sectors were distinctly observed. Infrared spectroscopy and ionizing radiation were adopted to reveal the distribution of point defects related to Si-Al substitution and OH-species. It was found a different distribution of Al-related centers in relation to the crystals grown from conventional Y-bar and Z-plate seeds

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Section: Segregation Of Al-and Oh-speciesmentioning

confidence: 87%

Section: Dislocations and Growth Sectorsmentioning

confidence: 99%

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Characterization of growth sectors in synthetic quartz grown from cylindrical seeds parallel to [0001] direction

et al. 2004

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“…This result can be attributed to an increase in the concentration of molecular water defects due to the coalescence of as-grown OH point defects. Previously, it was reported that the incorporation of OH-related defects was responsible for the growth striations appearing in X-ray diffraction topographies of the ÀX-growth sector (Iwasaki, 1980;Iwaski et al, 1990). Thus, the scattering intensities recorded along H 11 2 20 suggest that the linear density of water aggregates is higher along the [11 2 20] direction.…”

Section: Effect Of the Heat Treatmentmentioning

confidence: 95%

Two-dimensional small-angle X-ray scattering from as-grown and heat-treated synthetic quartz

et al. 2007

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The small-angle X-ray scattering (SAXS) in as-grown and heat-treated quartz crystals was investigated as a function of the azimuth angle around the primary beam. For this, samples parallel to (10 1 10) were extracted from Z-and ÀX-growth sectors of a synthetic quartz bar which had the OH content evaluated by infrared spectroscopy (IRS). In addition, SAXS and IRS were independently recorded as a function of heating temperature. As a result, the two-dimensional SAXS images revealed an anisotropic pattern randomly decorated by lowintensity Kossel lines. The intensities were projected along specific directions or were axially integrated around the primary beam. It was observed that the Porod invariant (Q) increased and the Kossel lines moved slightly to higher q values with increasing temperature. The effect of the sample orientation on the Q value and the lack of a clear relationship between Q and OH content suggested that the diffuse scattering due to the periodicity of the crystal lattice played an important role in the small-angle scattering of quartz. The net scattering intensities produced by heat-treatment at 873 K were attributed to molecular water aggregates created by the diffusion of as-grown OH defects.

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“…IBM, where the firstgeneration GF11 project started in 1983 [1,2,3], or TMC [4,5]. In Japan, cooperation of physics and computer science began in 1978 [6] continuing with the QCDPAX series [7]. In 1996, CPPACS, a long term leader of the TOP500 list, was built by CCP scientists together with computer industries [8,9].…”

Section: Introductionmentioning

confidence: 99%