2007
DOI: 10.1016/j.apsusc.2007.07.150
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Effect of laser annealing on crystallinity of the Si layers in Si/SiO2 multiple quantum wells

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Cited by 18 publications
(21 citation statements)
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“…Therefore, shifting of absorption edge in the quartz/Si structure towards shorter wavelengths is due to changes occurring in the silicon film. The observed absorption edge shifting in the spectra of the specimens under investigation correlates with the data given in [4], where it was shown that laser action on thin Si films at SiO 2 surface leads to similar effect because of silicon recrystallization.…”
Section: Resultssupporting
confidence: 74%
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“…Therefore, shifting of absorption edge in the quartz/Si structure towards shorter wavelengths is due to changes occurring in the silicon film. The observed absorption edge shifting in the spectra of the specimens under investigation correlates with the data given in [4], where it was shown that laser action on thin Si films at SiO 2 surface leads to similar effect because of silicon recrystallization.…”
Section: Resultssupporting
confidence: 74%
“…The increase of transmission coefficients for the quartz/Si, glass/Si, quartz/Si/SiO 2 and SiC/Si/SiO 2 structures that occurs after laser annealing correlates with the data given in [4] where increase of transmission coefficient in thin silicon films resulting from laser annealing was observed too. In [4] that effect was explained by the phase transition from -Si to poly-Si that appeared due to laser annealing.…”
Section: Resultssupporting
confidence: 70%
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