2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO) 2018
DOI: 10.1109/nano.2018.8626418
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Effect of metal contact size on the metal-semiconductor junction characteristics

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“…The area of the AFM tip within the PCM module is ≈50 nm 2 . [63][64][65] In addition, the laser irradiation on the sample appears as an ellipse spot with an area of 60.38 mm 2 (Figure S10, Supporting Information). When the power density increased from 31.7 to 79.4 mW cm −2 , the responsivities under 395 nm wavelength laser decreased from 43.6 to 18.2 A W −1 .…”
Section: Resultsmentioning
confidence: 99%
“…The area of the AFM tip within the PCM module is ≈50 nm 2 . [63][64][65] In addition, the laser irradiation on the sample appears as an ellipse spot with an area of 60.38 mm 2 (Figure S10, Supporting Information). When the power density increased from 31.7 to 79.4 mW cm −2 , the responsivities under 395 nm wavelength laser decreased from 43.6 to 18.2 A W −1 .…”
Section: Resultsmentioning
confidence: 99%