Effect of micro cracks on photovoltaic output power: case study based on real time long term data measurements

Dhimish, Mahmoud; Holmes, Violeta; Dales, Mark; Mehrdadi, Bruce

doi:10.1049/mnl.2017.0205

Cited by 46 publications

(26 citation statements)

References 18 publications

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“…Emission intensity is dependent on the density of defects in the silicon, with fewer defects resulting in more emitted photons [9]. The EL system should be placed in a dark room, as the image of the cells is being taken by cooled CCD camera, we have already published the configuration and construction of the EL setup in [10].…”

Section: Introductionmentioning

confidence: 99%

Novel Photovoltaic Micro Crack Detection Technique

Dhimish

Holmes

Mather

2019

IEEE Trans. Device Mater. Relib.

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This paper presents a novel detection technique for inspecting solar cells micro cracks. Initially, the solar cell is captured using Electroluminescence (EL) method, then processed by the proposed technique. The technique consist of three stages, the first stage combines two images, the first image is the crackfree (healthy) solar cell, whereas the second is the cracked solar cell image. Both output images processed into a bit-by-bit gridding technique, which enables the detection of all bits in the considered area of the cracked solar cell. The second stage uses an OR gate between each of the examined bits for both healthy and cracked solar cells. The final calibrated image presents a high quality, and low noise structure, thus easier to identify the micro crack size, location and its orientation. In order to examine the effectiveness of the proposed technique, three different cracked PV solar cells have been examined. The results show that the micro cracks size, orientation, and location is more visible using the proposed technique. In addition, the developed technique has been validated using a full scale PV module, and compared with up to date available PV micro crack detection methods.

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Section: Introductionmentioning

confidence: 99%

Novel Photovoltaic Micro Crack Detection Technique

Dhimish

Holmes

Mather

2019

IEEE Trans. Device Mater. Relib.

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“…This method is the form of luminescence in which electrons are excited into the conduction band using electrical current by connecting the inspected solar cell in forward biasing mode [7]. This method is frequently used since it can be applied not only on small small-scale solar cell sizes but also with full-scale PV panels [8]. In principle, the EL technique necessitates the inspected solar cell to be in the forward bias condition in order to yield infrared radiation, resulting an EL waves that varies from 950 to 1250 nm.…”

Section: Introductionmentioning

confidence: 99%

“…In principle, the EL technique necessitates the inspected solar cell to be in the forward bias condition in order to yield infrared radiation, resulting an EL waves that varies from 950 to 1250 nm. Emission peak intensity is reliant on the compactness of defects in the solar cell, with less defects resulting in extra emitted EL waves [9]. The EL setup would be preferable to be placed in a dark room to eliminate the interaction between EL waves and any other source of light.…”

Section: Introductionmentioning

confidence: 99%

“…The EL setup would be preferable to be placed in a dark room to eliminate the interaction between EL waves and any other source of light. In addition, the image of the cells cracks is typically taken by cooled charge-coupled device (CCD) camera; the configuration and construction of the EL setup is accessible in [10]. In a CCD image sensor, pixels are represented by p-doped metal-oxide-semiconductors (MOS) capacitors.…”

Section: Introductionmentioning

confidence: 99%

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Development of Novel Solar Cell Micro Crack Detection Technique

Dhimsih

Mather

2019

IEEE Trans. Semicond. Manufact.

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This paper presents the development of a solar cell inspection manufacturing execution system (MES). The main objective of the MES is to detect micro cracks in the manufacturing process of solar cells. Hence, to accept or reject a solar cell during the assembling unit. The proposed MES consists of three stages, at first stage, the inspection system will be placed on the manufacturing process of the solar cell. After the solar cell has been manufactured, it will pass under an in-line electroluminescent (EL) system. At this stage, an OR operation between a healthy/no-crack and the inspected solar cell image will be obtained. This OR operation will generate a better calibration for the cracks in the PV solar cell image. The final calibrated image presents a high quality, and low noise structure, thus easier to identify the micro cracks size, location and orientation. The last stage evaluates the calibrated image using the plot profile which is well known as the distance in pixels vs. the gray level of the image. The plot profile will indicate whether to accept or reject the solar cell, 10% confidence interval for the gray level was used to identify the upper and lower detection limits.

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“…Other reliability issues in PV modules such as PV micro cracks [9], PV module disconnection [10], maximum power point tracking (MPPT) efficiency [11], and PV wind speed and humidity variations [12]. These factors can affect the PV modules output power performance, thus decrease its annual yield energy.…”

Section: Introductionmentioning

confidence: 99%