2005
DOI: 10.1016/j.tsf.2005.05.004
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Effect of multi-coating process on the orientation and microstructure of lead zirconate titanate (PZT) thin films derived by chemical solution deposition

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Cited by 107 publications
(72 citation statements)
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“…It has been reported as (1 0 0)-oriented film [46]. This kind of (1 0 0)-oriented textured film exhibits higher dielectric constant than the randomly oriented film and the (1 1 1)-oriented film [46]. The deposited films were pyrolyzed at 200…”
Section: Design and Fabricationmentioning
confidence: 99%
“…It has been reported as (1 0 0)-oriented film [46]. This kind of (1 0 0)-oriented textured film exhibits higher dielectric constant than the randomly oriented film and the (1 1 1)-oriented film [46]. The deposited films were pyrolyzed at 200…”
Section: Design and Fabricationmentioning
confidence: 99%
“…The SOI wafers have 10 µm structural Si and 1 µm buried oxide (BOX). 16 The Pb/Ti/Zr composition of the precursor solution was 120/30/70 for tetra-PZT and 120/52/48 for MPB-PZT, respectively. After PZT deposition, Pt (150 nm)/Ti (10 nm) top electrodes were deposited.…”
Section: Methodsmentioning
confidence: 97%
“…For the nucleation and orientation of PZT on Pt/Ti electrodes, a Ti-enriched layer near the electrode interface may be formed due to the diffusion of active titanium element which facilitates the nucleation and in situ creates a perovskite-seeding layer for the rest of the film due to the chemical reaction [8]. At the same time, the obtained preferential orientation may be due to lattice matching between the PZT film and Pt layer [20,21]. Figure 2 shows the XRD patterns of the P 1.1 ZT films deposited on PT seeded Pt/Ti substrates under different annealing conditions.…”
Section: Crystallographic Phases Analysis By Xrd Methodsmentioning
confidence: 99%