2011
DOI: 10.1016/j.mseb.2011.02.001
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Effect of nitrogen doping concentration on the properties of TiO2 films grown by atomic layer deposition

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Cited by 25 publications
(15 citation statements)
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“…Moreover, Zhang et al demonstrated a deposition route based on H2-N2 plasma and Ti(NMe2)3(CpMe) [804]. The GPC values fall in the range typically reported for undoped TiO2 films, with a trend of decreasing GPC with increasing N content [65,128].…”
Section: N Dopingmentioning
confidence: 96%
“…Moreover, Zhang et al demonstrated a deposition route based on H2-N2 plasma and Ti(NMe2)3(CpMe) [804]. The GPC values fall in the range typically reported for undoped TiO2 films, with a trend of decreasing GPC with increasing N content [65,128].…”
Section: N Dopingmentioning
confidence: 96%
“…Generally speaking, there are two kinds of processes to prepare N-doped TiO 2 . One process can be ascribed as one-step direct incorporation of N atoms into TiO 2 lattice, such as sol-gel method [74][75][76], chemical vapor deposition (CVD) [77,78], atomic layer deposition (ALD) [79][80][81], hydrothermal method [82][83][84], solvothermal method [85][86][87][88], sol-hydrothermal process [89], hydrolysis-precipitation process [90], bioprocess-inspired method [91], electrochemical method [92][93][94], ion implantation [95,96], combustion method [97][98][99], mechanochemical method [100,101], low-temperature direct nitridization method [102], and microwave-assisted method [103]. [102].…”
Section: Preparationmentioning
confidence: 99%
“…Thus, at +0.6 V versus Ag/AgCl/0.1 m KCl, both impedance spectra and transient photocurrent were registered for TiO 2 /Fe 3 O 4 before and after its thermal annealing and are shown in Figure e,f, respectively. The results clearly show that Fe 3 O 4 /FTO samples do not show any special photoelectrochemical advantage; on the other hand, TiO 2 /Fe 3 O 4 /FTO shows an improvement over the TiO 2 /FTO control samples, which has been partially addressed by other studies and is attributed to the different electron transfer media . More interestingly, the annealed nanoparticles (TiO 2 /Fe 3 O 4 /FTO sample) clearly shows a high increment over the untreated sample, with an increment of almost ≈90% after N 2 adsorption, which in view of the UV–vis spectra (Figure S4, Supporting Information) clearly shows the influence of N 2 on the TiO 2 layer.…”
Section: Resultsmentioning
confidence: 72%
“…Nitrogen incorporation on the NPs was further confirmed by X‐ray photoelectron spectroscopy (XPS) measurements performed on as‐deposited (not annealed) and postannealed Fe 3 O 4 /FTO samples. Results are shown in Figure a, focusing on the region between 380 and 415 eV, where a peak around 400 eV, corresponding to the N 1s, clearly confirms the existence of molecularly absorbed nitrogen after the annealing process . The total nitrogen concentration was quantified as 1.2%, this value being slightly higher than the estimation by EELS measurements, but more reliable due to the larger area investigated in the XPS method (Figure S3, Supporting Information).…”
Section: Resultsmentioning
confidence: 77%