2013
DOI: 10.1016/j.materresbull.2013.07.009
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Effect of oxygen partial pressure on microstructural and optical properties of titanium oxide thin films prepared by pulsed laser deposition

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Cited by 26 publications
(16 citation statements)
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“…a significant increase in roughness: from 4.5 nm to 11.0 nm determined with droplets, and from 0.5 nm to 12.8 nm determined without droplets. The same relationship between roughness and gas pressure has been mentioned in many publications, where ceramic coatings were deposited by the PLD method [22][23][24][25][26]. It was explained by the relationship between the mobility of atoms and their kinetic energy [22,23,25,27].…”
Section: Methodsmentioning
confidence: 54%
“…a significant increase in roughness: from 4.5 nm to 11.0 nm determined with droplets, and from 0.5 nm to 12.8 nm determined without droplets. The same relationship between roughness and gas pressure has been mentioned in many publications, where ceramic coatings were deposited by the PLD method [22][23][24][25][26]. It was explained by the relationship between the mobility of atoms and their kinetic energy [22,23,25,27].…”
Section: Methodsmentioning
confidence: 54%
“…1) at higher substrate temperatures. The PL peak intensity decreases systematically with the increased substrate temperature [9]. The variation of PL peak intensity is related to the formation of rutile and anatase phases at different substrate temperatures.…”
Section: Microstructural Studiesmentioning
confidence: 88%
“…At 873 K, two PL peaks were observed, indicating the clear anatase and rutile peaks. The small intense peak ∼ 470 nm (2.7 eV) is probably due to the structural defects, which are related to deep-level emissions like oxygen vacancy [9,11,12]. The PL peak intensity of TiO 2 films with respect to substrate temperature is associated with its crystallinity and defects.…”
Section: Microstructural Studiesmentioning
confidence: 99%
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