2011
DOI: 10.1088/0022-3727/44/41/415401
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Effect of oxygen pressure on the grain and domain structure of polycrystalline 0.85PbMg1/3Nb2/3O3–0.15PbTiO3 thin films studied by scanning probe microscopy

Abstract: 0.85PbMg1/3Nb2/3O3–0.15PbTiO3 ferroelectric–relaxor thin films have been deposited on La0.5Sr0.5CoO3/(1 1 1) Pt/TiO2/SiO2/Si by pulsed laser ablation at various oxygen partial pressures in the range 0.05 to 0.4 Torr. All the films have a rhombohedral perovskite structure. The grain morphology and orientation are drastically affected by the oxygen pressure, studied by x-ray diffraction and scanning electron microscopy. The domain structure investigations by dynamic contact electrostatic force microscopy have re… Show more

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Cited by 3 publications
(1 citation statement)
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“…Piezoresponse force microscopy (PFM) (22)(23)(24) has been especially successful because of its intrinsically high resolution and the ability to follow the polarization statics and dynamics via a local piezoresponse. Researchers have studied several classes of relaxor materials, including single crystals [e.g., SBN (25)(26)(27)(28), PbMg 1/3 Nb 2/3 O 3 -PbTiO 3 (PMN-PT) (29)(30)(31)(32)(33)(34)(35)(36)(37)(38)(39)(40), and PbZn 1/3 Nb 2/3 O 3 -PbTiO 3 (PZN-PT) (41,42)], ceramics [e.g., (Pb,La)(Zr,Ti)O 3 (PLZT) (43)(44)(45), PMN-PT (46), and some lead-free compositions (47)(48)(49)], and thin films (50)(51)(52)(53). This review is devoted to the recent advances in PFM studies of relaxors and to a further understanding of the mechanisms of polarization behavior in these emergent functional materials.…”
Section: T (K) ε'/1000mentioning
confidence: 99%
“…Piezoresponse force microscopy (PFM) (22)(23)(24) has been especially successful because of its intrinsically high resolution and the ability to follow the polarization statics and dynamics via a local piezoresponse. Researchers have studied several classes of relaxor materials, including single crystals [e.g., SBN (25)(26)(27)(28), PbMg 1/3 Nb 2/3 O 3 -PbTiO 3 (PMN-PT) (29)(30)(31)(32)(33)(34)(35)(36)(37)(38)(39)(40), and PbZn 1/3 Nb 2/3 O 3 -PbTiO 3 (PZN-PT) (41,42)], ceramics [e.g., (Pb,La)(Zr,Ti)O 3 (PLZT) (43)(44)(45), PMN-PT (46), and some lead-free compositions (47)(48)(49)], and thin films (50)(51)(52)(53). This review is devoted to the recent advances in PFM studies of relaxors and to a further understanding of the mechanisms of polarization behavior in these emergent functional materials.…”
Section: T (K) ε'/1000mentioning
confidence: 99%