2017
DOI: 10.1016/j.jallcom.2017.06.313
|View full text |Cite
|
Sign up to set email alerts
|

Effect of oxygen vacancies on SrTiO electrical properties

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

4
12
0

Year Published

2018
2018
2022
2022

Publication Types

Select...
6
1
1

Relationship

0
8

Authors

Journals

citations
Cited by 69 publications
(16 citation statements)
references
References 38 publications
4
12
0
Order By: Relevance
“…7), which is consistent with dielectric relaxation in this region. These results are generally consistent with trends observed in experimental measurements of SrTiO 3 dielectric materials [48,49]. DFT calculations have shown that oxygen vacancies represent a major factor in the increase of dielectric permittivity in non-stoichiometric SrTiO 3 .…”
Section: Nature Of Dielectric Permittivitysupporting
confidence: 90%
“…7), which is consistent with dielectric relaxation in this region. These results are generally consistent with trends observed in experimental measurements of SrTiO 3 dielectric materials [48,49]. DFT calculations have shown that oxygen vacancies represent a major factor in the increase of dielectric permittivity in non-stoichiometric SrTiO 3 .…”
Section: Nature Of Dielectric Permittivitysupporting
confidence: 90%
“…5 (d)) this peak appears near to 100 kHz. For the maximum of peak observed in Z" spectrum is observed a shift for higher values with increasing of the temperature what can be related to the relaxation process thermally activated [50]. As can be seen in insets of Fig.…”
Section: Resultsmentioning
confidence: 51%
“…where f Max is the frequency when Z" has a maximum value, f o is the pre-exponential term, E a is the activation energy of the process, K b is the Boltzmann constant and T is temperature [50]. The E a are determined by the angular coefficient of linear curves in Nyquist's plots (Z" versus Z') were also analyzed.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…8. This indicates enhanced mobile charge hopping in the grain boundaries and sample-electrode interfaces [35,60]. The interfacial charges can produce a thin conductive layer at the sample surface effectively reducing the resistivity at high frequencies.…”
Section: F Resistivity Measurementsmentioning
confidence: 99%