1994
DOI: 10.1117/12.182140
|View full text |Cite
|
Sign up to set email alerts
|

Effect of piezoelectricity on the photorefractive gain in a bismuth silicate crystal

Abstract: The application of a voltage, Vo, across a photorefractive crystal in the presence of detuning is well known as a means of enhancing twowave gain. By mounting a crystal of bismuth silicate, with faces cut parallel to the (001), (110) and (110) planes, in a rotating holder, measurements of two. wave gain as a function of 0, the angle between the electric field vector Eo (in the [001] direction) and the grating vector, K (in the (1 TO) plane), have been made. Our results show that by having a nonzero value of 0 … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
2
0

Year Published

1997
1997
1997
1997

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 6 publications
0
2
0
Order By: Relevance
“…3) where the grating vector is tilted an angle c with respect to the electric field. The deviation from the planar orientation was found to produce an increase in photorefractive gain [13]. The origin of this increase is connected with photoelastic and piezoelectric effects [13,14].…”
mentioning
confidence: 97%
See 1 more Smart Citation
“…3) where the grating vector is tilted an angle c with respect to the electric field. The deviation from the planar orientation was found to produce an increase in photorefractive gain [13]. The origin of this increase is connected with photoelastic and piezoelectric effects [13,14].…”
mentioning
confidence: 97%
“…The deviation from the planar orientation was found to produce an increase in photorefractive gain [13]. The origin of this increase is connected with photoelastic and piezoelectric effects [13,14]. To find the direction of maximum Q we injected a weak beam into the crystal at different angles c and u and measured the amplification of the beam intensity.…”
mentioning
confidence: 99%